Applied Scanning Probe Methods IV. Nanoscience and Technology, Band 4

Seitenzahl:

284

Gewicht:

586 g

Erschienen bei:

Springer

Kurzbeschreibung

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques. TOC:Joseph M. Kinsella and Albena Ivanisevic: Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Carmen LaTorre and Bharat Bhushan: Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- James D. Batteas and Jayne C. Garno: Nanofabrication with Self-Assembled Monolayers by Scanned Probe Lithography.- Ricardo Garcia, Fernando Garcia, and Marta Tello: Fabrication of Nanometer-scale Structures and Devices by Local Oxidation Nanolithography.- Chen Wang and Chunli Bai: Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy.- Hans Peter Lang, Martin Hegner, Christoph Gerber: Microfabricated Cantilever Array Sensors for (Bio-)chemical Detection.- B. Gotsmann, U. Dürig: Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- William P. King and Brent A. Nelson: Applications of Heated Atomic Force Microscope Cantilevers.

Beschreibung

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Portrait

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.

Mehr über...

Mehr über:  Nanotechnologie, Elektronenmikroskopie - Raster-Tunnel-Mikroskopie, Rasterelektronenmikroskopie, Technologie / Nanotechnologie, Raster-Tunnel-Mikroskopie ( Elektronenmikroskopie ), Abtastung (Technik), Material Science, Physical Chemistry, Microscopy, Nanoscience

Mehr von: 

Mehr von:  Harald Fuchs, Bharat Bhushan, Springer-Verlag GmbH