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Foundations of Statistical Inference. Contributions to Statistics

   von Yaacov Ritov, Yoel Haitovsky, Hans Rudolf Lerche

buch.de-Verkaufsrang:
ISBN-10:
3-7908-0047-3
ISBN-13:
978-3-7908-0047-0
Erschienen:
05.2003
Titel voraussichtlich versandfertig innerhalb 3 Wochen.
Aus der Reihe:
«Contributions to Statistics»
Einband:
kartoniert/broschiert
Sonstiges:
XII, 23 SW-Abbildungen, 18 Tabellen, 23 SW-Zeichnungen 235 mm
Seitenzahl:
230
Gewicht:
374 g
Erschienen bei:
Physica Verlag
Herausgeber: Yaacov Ritov Herausgeber: Yoel Haitovsky Herausgeber: Hans Rudolf Lerche

Beschreibung

This volume is a compressed survey containing recent results on statistics of stochastic processes and on identification with incomplete observations. It comprises a collection of papers presented at the Shoresh Conference 2000 on the Foundation of Statistical Inference. The papers cover the following areas with high research activity:
- Identification with Incomplete Observations, Data Mining,- Bayesian Methods and Modelling,- Testing, Goodness of Fit and Randomness,- Statistics of Stationary Processes. TOC:Part I: Identification with Incomplete Observations, Data Mining.- Part II: Bayesian Methods and Modelling.- Part III: Testing, Goodness of Fit and Randomness.- Part IV: Statistics of Stationary Processes.

Kurzbeschreibung

This volume is a compressed survey containing recent results on statistics of stochastic processes and on identification with incomplete observations. It comprises a collection of papers presented at the Shoresh Conference 2000 on the Foundation of Statistical Inference. The papers cover the following areas with high research activity:- Identification with Incomplete Observations, Data Mining,- Bayesian Methods and Modelling,- Testing, Goodness of Fit and Randomness,- Statistics of Stationary Processes.



Mehr über...
  • Mehr über:  Data Mining (EDV), Bayes-Verfahren, Inferenz, Data Mining, Statistical Inference, Bayesian Methods, Statistical Modelling, Identification with Incomplete Observation, Statistics of Stationary Processes
  • Mehr von: 
  • Mehr von:  Yaacov Ritov, Yoel Haitovsky, Hans Rudolf Lerche, Physica-Verlag


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