Two-Dimensional X-Ray Diffraction

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.

Bob Baoping He is the Director of R&D and Engineering at Bruker AXS (formerly Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech and holds twelve U.S. patents.

The fundamentals, theory, and wide-ranging applications of two-dimensional X-ray diffraction

Two-Dimensional X-Ray Diffraction is proving itself as an ideal non-destructive, analytical method for measuring the atomic arrangement of materials and extracting an array of information beyond the limitations of conventional X-ray diffraction. Researchers in materials science, chemistry, physics, pharmaceuticals, and related fields will find this introductory reference invaluable in understanding and applying two-dimensional X-ray diffraction for examining a broad range of samples.

Two-Dimensional X-Ray Diffraction shows how two-dimensional X-ray diffraction can be a useful tool for the examination of metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials and composites for material science researches, molecular structure determination and polymorphism study for drug discovery and processing, and samples with micro volume or micro-area for forensic analysis, and archaeology analysis, to name just a few of the method's applications.

The text covers:
* The fundamentals of X-ray diffraction and its extension to two-dimensional X-ray diffraction
* The geometry conventions and diffraction vector approach for diffraction data interpretation, data correction, and process algorithms for various applications
* Instrumentation technologies, including the critical components, such as X-ray source and optics, two-dimensional detectors, goniometer, and sample stages
* The configurations of the two-dimensional X-ray diffraction systems for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening
* Experimental examples in materials research, pharmaceuticals, materials processing, and quality control

Written by one of the pioneers in the field, Two-Dimensional X-Ray Diffraction brings readers up to speed on a fast-rising, state-of-the-art method for materials characterization.

Preface.

1. Introduction.

1.1 X-Ray Technology and Its Brief History.

1.2 Geometry of Crystals.

1.3 Principles of X-Ray Diffraction.

1.4 Reciprocal Space and Diffraction.

1.5 Two-Dimensional X-Ray Diffraction.

2. Geometry Conventions.

2.1 Introduction.

2.2 Diffraction Space and Laboratory Coordinates.

2.3 Detector Space and Detector Geometry.

2.4 Sample Space and Goniometer Geometry.

2.5 Transformation from Diffraction Space to Sample Space.

2.6 Summary of XRD2 Geometry.

References.

3. X-Ray Source and Optics.

3.1 X-Ray Generation and Characteristics.

3.2 X-Ray Optics.

References.

4. X-Ray Detectors.

4.1 History of X-Ray Detection Technology.

4.2 Point Detectors in Conventional Diffractometers.

4.3 Characteristics of Point Detectors.

4.4 Line Detectors.

4.5 Characteristics of Area Detectors.

4.6 Types of Area Detectors.

5. Goniometer and Sample Stages.

5.1 Goniometer and Sample Position.

5.2 Goniometer Accuracy.

5.3 Sample Alignment and Visualization Systems.

5.4 Environment Stages.

References.

6. Data Treatment.

6.1 Introduction.

6.2 Nonuniform Response Correction.

6.3 Spatial Correction.

6.4 Detector Position Accuracy and Calibration.

6.5 Frame Integration.

6.6 Lorentz, Polarization, and Absorption Corrections.

7. Phase Identification.

7.1 Introduction.

7.2 Relative Intensity.

7.3 Geometry and Resolution.

7.4 Sampling Statistics.

7.5 Preferred Orientation Effect.

References.

8. Texture Analysis.

8.1 Introduction.

8.2 Pole Density and Pole Figure.

8.3 Fundamental Equations.

8.4 Data Collection Strategy.

8.5 Texture Data Process.

8.6 Orientation Distribution Function.

8.7 Fiber Texture.

8.8 Other Advantages of XRD2 for Texture.

References.

9. Stress Measurement.

9.1 Introduction.

9.2 Principle of X-Ray Stress Analysis.

9.3 Theory of Stress Analysis with XRD2.

9.4 Process of Stress Measurement with XRD2.

9.5 Experimental Examples.

Appendix 9.A Calculation of Principal Stresses from the General Stress Tensor.

Appendix 9.B Parameters for Stress Measurement.

References.

10. Small-Angle X-Ray Scattering.

10.1 Introduction.

10.2 2D SAXS Systems.

10.3 Application Examples.

10.4 Some Innovations in 2D SAXS.

References.

11. Combinatorial Screening.

11.1 Introduction.

11.2 XRD2 Systems for Combinatorial Screening.

11.3 Combined Screening with XRD2 and Raman.

12. Quantitative Analysis.

12.1 Percent Crystallinity.

12.2 Crystal Size.

12.3 Retained Austenite.

References.

13. Innovation and Future Development.

13.1 Introduction.

13.2 Scanning Line Detector for XRD2.

13.3 Three-Dimensional Detector.

13.4 Pixel Direct Diffraction Analysis.

References.

Appendix A. Values of Commonly Used Parameters.

Appendix B. Symbols.

Index.

Bob B. He 

Science Theoretische Chemie Chemistry Analytic Chemistry / Analytic 

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